There's an updated release available: https://github.com/tom-seddon/beeb_test ... 56-61c1369
Changes, mostly as above:
--Tom
Changes, mostly as above:
- Updated (and hopefully that means improved!) code and docs, as per previous discussion. There's now an actual explanation of how to use the ROM, the combined ignore mask is shown on screen, and there's tables in the docs letting you map ignore mask to likely failing ICs
- The key for the visual bits test is now V
- The key for the memory test with options is now O
--Tom
Statistics: Posted by tom_seddon — Sat Aug 02, 2025 1:51 pm